Designed for best possible signal generation

The 81150A is stressed and tested to device limits in a wide range of applications, including digital and mixed-signal device testing, radar range testing, and sensor simulation.

• Accurate signal testing for devices other than signal sources
  
  
• Versatile waveform and noise generation to meet current and future stress test challenges
  
  
• A plug-and-play solution that integrates everything into one instrument to minimize wiring, space, and test time

Refer to the Configuration Guide to check which options are applicable to the product.